Semiconductor Test Probe CPM-021

CPM provides a series of semiconductor test probe products. Our products offer high-performance compliance, extremely low and stable DC resistance. The products are developed specifically for semiconductor testing and can be applied with various sockets for examinations. The testing factories can ensure the comprehensive inspections of the connections among electrical parts on ICs before the shipment by changing the types of contact probes based on the features of testing objectives. Materials and finishes: 1. Plunger-Top BeCu / Au Plated 2. Plunger-Bottom BeCu / Au Plated 3. Barrel P.B. / Au Plated 4. Spring Music Wire / Au Plated Mechanical: 1. Spring Force 11g*m 2. Full Travel 1.0mm 3. Recommend Travel 0.65mm 4. Mechanical Life 50K Electrical: 1. Current Rating 0.3A 2. Self Inductance 1.15nH 3. Capacitance 1.38pF

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