Semiconductor IC Aging Test

Artificial Steam Aging Test Chamber For Semiconductor Ic Test 1Mircocomputer controller 2SUS#304 stainless steel 3Heat-up time: 45min 4Controller: SSR+PID Description Artificial Steam Aging Test Chamber For Semiconductor Ic Test is used to test and determine the parameters, performance of electrical, electronics, other products and materials for high temperature, low temperature, or the temperature of the thermostat test environmental changes. Specification 1. Microcomputer controller 2. Reverse osmosis water purifier 3. PID + S. S. R 4. Excellent performance 5. Resonable price Features Made of SUS#304 stainless steel plate. Controlled by microcomputer digital LED. Having time planning function. Having safety device, including multi over-temperature protection and power off when out of water. Testing high temperature/high humidity to spare pares, components. Digital electronic indicators + S. S. R with PID automatic calaulation capabilitty. Controlled by micro computer digital LED. Have time planning function, the maximum setting is 9990 minutes. Detailed Data Model YSA-3 YSA-4 YSA-6 Test area size W*H*D (cm) 10*5.4*26(3 sets) 10*5.4*26(4 sets) 10*5.4*26(6 sets) Exterior chamber size W*H*D (cm) 53*70.5*54.9 68*70.5*54.9 80*70.5*54.9 Temperature range RT+10oC~98oC Temperature fluctuation ±0.3oC Temp.resolution ±0.1oC Heating time 45 min Exterior chamber material SUS#304 stainless steel Interior chamber material SUS#304 stainless steel Insulation material Fiberglass wool Heating system Stainless steel high speed heater Control system Button type digital display controller Safety device Phase sequence protection, over temperature protection, overload protection Power supply AC 1ψ220V 60/50Hz Customization service Non-standard or special requirements are all welcome Company Introduce

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